Blank Cover Image

Contactless Measurement of Minority Carrier Lifetime in Silicon

Author(s):
Publication title:
Semiconductor Devices
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2733
Pub. date:
1996
Page(from):
304
Page(to):
306
Pub. info.:
Bellingham, WA — New Delhi: SPIE-The International Society for Optical Engineering — Narosa
ISSN:
0277786X
ISBN:
9780819421142 [0819421146]
Language:
English
Call no.:
P63600/2733
Type:
Conference Proceedings

Similar Items:

James S. Swirhun, M. Keith Forsyth, Tanaya Mankad, Ronald A. Sinton

Materials Research Society

Varker, C. J., Whitfield, J. C., Fejes, P. L.

North-Holland

Kitamura, T., Tamura, F., Hara, T., Hourai, M., Tsuya, H.

Electrochemical Society

Ulyashin, A., Simoen, E., Camel, L., De Wolf, S., Dekkers, H., Rafi, J.M., Beaucarne, G., Poortmans, J., Claeys, C.

Electrochemical Society

Subramanian,V., Subrahmanyan,A., Murthy,V.R.K.

SPIE - The International Society for Optical Engineering

W. Goldfarb

Society of Photo-optical Instrumentation Engineers

Sheng, Josephine, Carroll, Malcolm S.

Materials Research Society

Venkatasubramanian, R., Timmons, M. L., Bothra, S., Borrego, J. M.

Materials Research Society

Palais,O., Yakimov,E., Simon,J.J., Martinuzzi,S.

Electrochemical Society, SPIE-The International Society for Optical Engineering

Cornish, J. C. L., Subaer, Jennings, P., Hefter, G. T.

MRS - Materials Research Society

Palais, O., Yakimov, E., Simon, J.J., Martinuzzi, S.

Electrochemical Society

Chan, S.S., Varker, C. J., Whitfield, J., Carpenter, R. W.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12