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Simulation of Radiation Effects in MOSFETs

Author(s):
Ekbote,S.
Tambe,D.
Zaman,P.
Dangat,H.K.
Khare,M.
Sinha,P.
Rodd,S.
Bukhanwala,N.
Vasi,J.
Sharma,D.K.
Das,A.
6 more
Publication title:
Semiconductor Devices
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2733
Pub. Year:
1996
Page(from):
57
Page(to):
59
Pub. info.:
Bellingham, WA — New Delhi: SPIE-The International Society for Optical Engineering — Narosa
ISSN:
0277786X
ISBN:
9780819421142 [0819421146]
Language:
English
Call no.:
P63600/2733
Type:
Conference Proceedings

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