The Comparison of SOI Transistor Models

The Comparison of SOI Transistor Models

Author(s):

Publication title:

Semiconductor Devices

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2733

Pub. Year:

1996

Page(from):

11

Page(to):

18

Pub. info.:

Bellingham, WA — New Delhi: SPIE-The International Society for Optical Engineering — Narosa

ISSN:

0277786X

ISBN:

9780819421142 [0819421146]

Language:

English

Call no.:

P63600/2733

Type:

Conference Proceedings

Details

TDL ID:	ZA00018408
Series ID:	PA00000029

Similar Items:

1 Conference Proceedings Modelling and Characterization of SOI Devices Andrzej Jakubowski, Malgorzata Jurczak, Lukasiak Lidia Narosa Publishing House	7 Conference Proceedings A Small-Signal Non-Quasistatic Model of Partially Depleted SOI MOSFETs Daniel Tomaszewski, Jan Gibki, Andrzej Jakubowski, Malgorzata Jurczak Narosa Publishing House
2 Conference Proceedings Analytical I-V description of thin-film SOI MOSFET with position-dependent mobility model Jurczak, M., Jakubowski, A. Electrochemical Society	8 Conference Proceedings Non-Contact Electrical Characterisation of SOI Surfaces Lukasiak, L, Roman, P, Brubaker, M, Anc, M, Ruzyllo, I Electrochemical Society
3 Conference Proceedings Measurement and Modelling of SOI MOSFETs Capacitances Tomaszewski, D., Lukasiak, L., Gibki, J., Domanski, K., Jakubowski, A., Zareba, A. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Comparison of partially and fully depleted SOI transistors down to the sub 50-nm-gate length regime Dreeskornfeld, L., Hartwich, J., Landgraf, E., Luyken, R.J., Roesner, W., Schulz, T., Staedele, M., Schmitt-Landsiedel, … Electrochemical Society
4 Conference Proceedings DC and AC models of partially-depleted SOI MOSFETs in weak inversion Tomaszewski, D., Domanski, K., Lukasiak, L., Zareba, A., Gibki, J., Jakubowski, A. Kluwer Academic Publishers	10 Conference Proceedings Interface Trap Characterization Using Charge-Pumping Method Nowak,B., Jakubowski,A., Szostak,S., Gawrys,R., Lukasiak SPIE-The International Society for Optical Engineering, Narosa
5 Conference Proceedings Feasibility of surface photovoltage based characterization of ultra-thin SOI wafers Lukasiak, L., Kamieniecki, E., Jakubowski, A., Ruzyllo, J. Electrochemical Society	11 Conference Proceedings A. Comparison of C-V and I-V Characteristics of Partially and Fully Depleted Gate-Controlled Diodes Gibki,J., Jakubowski,A., Jurezak,M., Tomaszewski,D. Narosa Publishing House
6 Conference Proceedings Silicon Microelectronics for Speed Jakubowski,Andrzej, Lukasiak,Lidia, Jurczak,Malgorzata SPIE - The International Society for Optical Engineering	12 Conference Proceedings Impact of Halo Implantation on the Lifetime Assessment in Partially Depleted SOI Transistors M. Galeti, J. A. Martino, E. R. Simoen, C. L. Claeys Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12