Influence of auger recombination on the temperature sensitivity of bulk and strained quantum well 1.3-ｦﾌm semiconductor lasers

Influence of auger recombination on the temperature sensitivity of bulk and strained quantum well 1.3-ｦﾌm semiconductor lasers

Author(s):

Publication title:

Physics and Simulation of Optoelectronic Devices IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2693

Pub. Year:

1996

Page(from):

592

Page(to):

599

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420671 [0819420670]

Language:

English

Call no.:

P63600/2693

Type:

Conference Proceedings

Details

TDL ID:	ZA00018404
Series ID:	PA00000029
Conf. info. (Name):	Photonics West : Physics and Simulation of Optoelectoronic Devices
Conf. info. (Number):	1996 : 4th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1996.01.29-1996.02.02

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