Analysis of VCSEL degradation modes
- Author(s):
Herrick,R.W. ( Univ.of California/Santa Barbara ) Cheng,Y.M. Beck,J.M. Petroff,P.M. Scott,J.W. Peters,M.G. Robinson,G.D. Coldren,L.A. Morgan,R.A. Hibbs-Brenner,M.K. - Publication title:
- Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2683
- Pub. Year:
- 1996
- Page(from):
- 123
- Page(to):
- 133
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420572 [0819420573]
- Language:
- English
- Call no.:
- P63600/2683
- Type:
- Conference Proceedings
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