Reliability of proton-implanted VCSELs for data communications

Reliability of proton-implanted VCSELs for data communications

Author(s):

Publication title:

Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2683

Pub. Year:

1996

Page(from):

102

Page(to):

113

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420572 [0819420573]

Language:

English

Call no.:

P63600/2683

Type:

Conference Proceedings

Details

TDL ID:	ZA00018403
Series ID:	PA00000029
Conf. info. (Name):	Photonics West : Fabrication, testing, and reliability of semiconductor lasers
Conf. info. (Number):	1996
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1996.01.31-1996.02.01

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