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Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes

Author(s):
Publication title:
Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2683
Pub. Year:
1996
Page(from):
74
Page(to):
80
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420572 [0819420573]
Language:
English
Call no.:
P63600/2683
Type:
Conference Proceedings

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