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Study of Irradiation-Induced Vacancy Defects and Shallow Positron Traps in Silicon

Author(s):
Publication title:
Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997
Title of ser.:
Materials science forum
Ser. no.:
255-257
Pub. date:
1997
Page(from):
602
Page(to):
604
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497799 [087849779x]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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SPIE-The International Society for Optical Engineering

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