Blank Cover Image

X-Ray Diffraction Study of Texture Evolution in Electrodeposited Zinc Layers

Author(s):
Tomov,I.  
Publication title:
ICOTOM-10 : proceedings of the 10th International Conference on Textures of Materials, Clausthal, Germany, 20-24 September 1993
Title of ser.:
Materials science forum
Ser. no.:
157-162
Pub. date:
1994
Vol.:
Part2
Page(from):
1495
Page(to):
1500
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496815 [0878496815]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Tomov,I.

Trans Tech Publications

Tomov, l. V., Chen, J., Zhang, H., Rentzepis, P. M.

SPIE - The International Society of Optical Engineering

Tomov V. I., Chen P., Rentzepis M. P.

Kluwer Academic Publishers

Tomov, I., Yamakov, V.

Trans Tech Publications

I.V. Tomov, P. Chen, P.M. Rentzepis

Society of Photo-optical Instrumentation Engineers

Tomov, I.

Trans Tech Publications

Wolska,E., Wolski,W., Kaczmarek,J.

Trans Tech Publications

Barsony, Istvan, Klappe, Joe G. E., Ryan, Tom W.

Materials Research Society

Gao, X., Brown, D. W., Brinson, L. C.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12