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X-Ray Texture Analysis in Films by the Reflection Method:Principal Aspects and Applications

Author(s):
Publication title:
ICOTOM-10 : proceedings of the 10th International Conference on Textures of Materials, Clausthal, Germany, 20-24 September 1993
Title of ser.:
Materials science forum
Ser. no.:
157-162
Pub. Year:
1994
Vol.:
Part2
Page(from):
1379
Page(to):
1386
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496815 [0878496815]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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