
Advantages of SOI technology in low-voltage ULSIs (Invited Paper)
- Author(s):
Yoshimi,M. ( Toshiba Corp. (Japan) ) Kawanaka,S. ( Toshiba Corp. (Japan) ) Yamada,T. ( Toshiba Corp. (Japan) ) Terauchi,M. ( Toshiba Corp. (Japan) ) Shino,T. ( Toshiba Corp. (Japan) ) Fuse,T. ( Toshiba Corp. (Japan) ) Oowaki,Y. ( Toshiba Corp. (Japan) ) Watanabe,S. ( Toshiba Corp. (Japan) ) - Publication title:
- Microelectronic Device Technology : 1-2 October 1997, Austin, Texas
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3212
- Pub. Year:
- 1997
- Page(from):
- 178
- Page(to):
- 187
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426444 [081942644X]
- Language:
- English
- Call no.:
- P63600/3212
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
![]() Electrochemical Society |
SPIE-The International Society for Optical Engineering |
8
![]() Electrochemical Society |
Electrochemical Society |
9
![]() Electrochemical Society |
4
![]() Electrochemical Society |
10
![]() SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
![]() SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |