Proximity-bias swing: origin and characterization
- Author(s):
- Zandbergen,P. ( Philips Research Labs. (Netherlands) )
- Gehoel-van,Ansem,W. ( Philips Research Labs. (Netherlands) )
- de Klerk,J. ( Philips Semiconductors (Netherlands) )
- Vandenberghe,G. ( IMEC (Belgium) )
- Linskens,F. ( Shipley Europe (Netherlands) )
- Publication title:
- Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3333
- Pub. Year:
- 1998
- Vol.:
- Part 2
- Page(from):
- 837
- Page(to):
- 844
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427786 [0819427780]
- Language:
- English
- Call no.:
- P63600/3333
- Type:
- Conference Proceedings
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