Vibration measurement by atomic force microscopy with laser readout
- Author(s):
- Snitka,V.J. ( Kaunas Univ.ot Technology (Lithuania) )
- Mizariene,V. ( Kaunas Univ.ot Technology (Lithuania) )
- Kalinauskas,M. ( Kaunas Univ.ot Technology (Lithuania) )
- Lucinskas,P. ( Kaunas Univ.ot Technology (Lithuania) )
- Publication title:
- Third International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 16-19 June, 1998, Ancona, Italy
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3411
- Pub. Year:
- 1998
- Page(from):
- 635
- Page(to):
- 639
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428639 [0819428639]
- Language:
- English
- Call no.:
- P63600/3411
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Materials surface topography and composition imaging using dynamic atomic force microscopy
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
Laser-pulse-induced chemical reactions and surface patterning in Co-Si and Co-Ti-Si films: investigations by x-ray diffraction and atomic force microscopy
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Atomic force microscopy investigation of supramolecular self-assembly of the porphyrin nanotubules
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
5
Conference Proceedings
Characterization of porous silicon for solar cell application by atomic force microscopy
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Measurements of Resonance Frequency of Parylene Microspring Arrays Using Atomic Force Microscopy
Materials Research Society |