Labardi M., Allegrini M., Ascoli C., Frediani C., Salerno M.
Kluwer Academic Publishers
|
Labardi, M., Zavelani-Rossi, M., Polli, D., Celebrano, M., Cerullo, G., Allegrini, M., De Silvestri, S.
SPIE - The International Society of Optical Engineering
|
Labardi M., Bassani F. G., Allegrini M.
Kluwer Academic Publishers
|
Voltolini, M., Artioli, G., Moret, M.
Elsevier Science B.V.
|
Sanchez, G., Polo, M. C., Wang, W. L., Esteve, J.
MRS - Materials Research Society
|
Loi, S., Wind, M., Preuss, M., Butt, H.-J., Spiess, H.W., Jonas, U.
Elsevier
|
Neubauer, Gabi, Cohen, Sidney R., McClelland, Gary M.
Materials Research Society
|
Overney, Rene M., Guo, Lantao, Totsuka, Hirono, Rafailovich, Miriam, Sokolov, Jonathan, Schwarz, Steven A.
MRS - Materials Research Society
|
Walters,D.A., Viani,M., Paloczi,G.T., Schaffer,T.E., Cleveland,J.P., Wendman,M.A., Gurley,G., Elings,V., Hansma,P.K.
SPIE-The International Society for Optical Engineering
|
Ogletree F. D., Hu J., Xiao D. X., Morant C., Dai Q., Vollmer R., Carpick R., Salmeron M.
Kluwer Academic Publishers
|
Cao, J., Pham, D.K., Tonge, L., Nicolau, D.V.
SPIE-The International Society for Optical Engineering
|
Aindow, M., Cheng, T.T., Jones, I.P., Astles, M.G., Williams, D.J.
Materials Research Society
|