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Integration and testing of the compact high-resolution imaging spectrometer(CHRIS)

Author(s):
Publication title:
Imaging spectrometry V : 19-21 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3753
Pub. date:
1999
Page(from):
180
Page(to):
191
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432391 [0819432393]
Language:
English
Call no.:
P63600/3753
Type:
Conference Proceedings

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