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Effect of carrier low-field mobility model on low-temperature drain current-voltage simulation of CMOS devices

Author(s):
Publication title:
Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3698
Pub. Year:
1999
Page(from):
462
Page(to):
467
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431721 [0819431729]
Language:
English
Call no.:
P63600/3698
Type:
Conference Proceedings

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