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Formation and observation of ferroelectric domains in PbZr1-xTixO3(PZT)thin films using atomic force microscopy

Author(s):
Shin,H. ( Samsung Advanced Institute of Technology )
Lee,K.
Lim,G.
Jeon,J.U.
Pak,Y.E.
Hong,S.
No,K.
2 more
Publication title:
Smart structures and materials 1999 : Smart materials technologies : 3-4 March 1999, Newport Beach, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3675
Pub. date:
1999
Page(from):
94
Page(to):
102
Pub. info.:
Bellingham: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431493 [0819431494]
Language:
English
Call no.:
P63600/3675
Type:
Conference Proceedings

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