Measurements of refractive index and physical thickness using optical coherence tomography

Measurements of refractive index and physical thickness using optical coherence tomography

Author(s):

Song,G. ( Shanghai Institute of Optics and Fine Mechanics )

Publication title:

International Conference on Sensors and Control Techniques (ICSC 2000)

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4077

Pub. Year:

2000

Page(from):

171

Page(to):

174

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437143 [081943714X]

Language:

English

Call no.:

P63600/4077

Type:

Conference Proceedings

Details

TDL ID:	ZA00018063
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Sensors and Control Techniques - ICSC
Conf. info. (Number):	2000
Conf. info. (Venue):	Wuhan, China
Conf. info. (Date):	2000.06.19-2000.06.21

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