Blank Cover Image

Detection of facial features based on the relaxation algorithm

Author(s):
Publication title:
Visual Communications and Image Processing 2000
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4067
Pub. Year:
2000
Vol.:
Part2
Page(from):
1074
Page(to):
1081
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437037 [0819437034]
Language:
English
Call no.:
P63600/4067
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Detection and tracking of facial features based on stereo video

Wu,Q., Xu,G., Zhuang,L.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Adaptive target segmentation using runtime-weighted features

J.-H. Jung, H.-S. Lee, D.-J. Park, C.-H. Park, J.-I. Lee

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Nonablative laser treatment of facial rhytides

Lask,G.P., Lee,P.K., Seyfzadeh,M., Nelson,J.S., Milner,T.E., Anvari,B., Dave,D., Geronemus,R.G., Bernstein,L.J., …

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Robust TV commercial detection based on audiovisual features

Lee, S.-H., Yeh, C.H., Kuo, C.-C.J.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Detection and tracking of facial features under a complex background

Zhuang, L., Xu, G., Ai, H., Song, G.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Hough transform for line and plane detection based on the conjugate formulation

Lee,H.-J., Ahn,H.-J., Song,J.-H., Park,R.-H.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Algorithm fusion for a land-based warning system to enhance detection and tracking performance

Park, Y.W., Lee, B.W., Park, J.S., Kim, D.J.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Lithography process margin enhancement using illumination based assist pattern [6283-68]

Moon, J., Lee, -J. D., Sim, -H. G., Eum, -D. J., Nam, -H. B., Yim, G. D.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Impedance-based damage detection for civil infrastructures

Park, S., Roh, Y.R., Yi, J.H., Yun, C.-B., Kwak, H.-G., Lee, S.H.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Fluorescent intensity-based differential counting of FITC-doped silica nanoparticles: applications of CD4+ T-cell detection in microchip-type flowcytometers

H. Yun, H. Bang, W. G. Lee, H. Lim, J. Park, J. Lee, A. Riaz, K. Cho, C. Chung, D. -C. Han, J. K. Chang

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Impedance based corrosion detection

Simmers, Jr. , G. E., Sodano, H. A., Park, G., Inman, D. J.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Transient Charging Effects and Its Implications to The Reliablility of High-k Dielectrics

Lee, B. H, Choi, R, Harris, R, Krishan, S. A, Young, C. D, Sim, J., Bersuker, G

Springer
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12