Blank Cover Image

IDENTIFICATION OF THE 0.15 eV DONOR DEFECT IN BULK GaAs

Author(s):
Publication title:
Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
325
Pub. Year:
1994
Page(from):
431
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992245 [1558992243]
Language:
English
Call no.:
M23500/325
Type:
Conference Proceedings

Similar Items:

Fang, Z-Q., Hemsky, J. W., Look, D. C., Mack, M. P., Molnar, R. J., Via, G. D.

MRS - Materials Research Society

Lo, S.C., Hsieh, L.K., Yeh, J.B., Pai, Y.-C., Tseng, W., Lin, M., Peterson, I.B.

SPIE-The International Society for Optical Engineering

Fang, S., Dobuzinsky, D., Gutmann, A.

Electrochemical Society

Chang, Z.-W., Wu, C.-M., Mo, M., Shieh, C.-C., Cheng, D.S., Chen, C.-C., Yang, R.Y., Randall, D.W., Yu, W.-C.

SPIE - The International Society of Optical Engineering

Hyun, Y.-S., Kim, D.-J., Koh, C.-W., Park, S.-N., Kwon, W.-T.

SPIE-The International Society for Optical Engineering

Kim,B.-K., Lee,S.-J., Lee,D.-Y., Lee,J.-W., Nam,J.-L.

SPIE-The International Society for Optical Engineering

Resnick, P.J., Adkins, C.L.J., Clews, P.J., Thomas, E.V., Cannaday, S.T.

Electrochemical Society

Okoroanyanwu,U., Pike,C., Levinson,H.J.

SPIE - The International Society for Optical Engineering

Fang, Z-Q., Look, D. C.

MRS - Materials Research Society

Manasreh, M.O., Evans, K.R., Stutz, C.E., Look,D.C., Hemsky, J.

Materials Research Society

Fang, Z-Q., Look, D.C.

Materials Research Society

Uppal, P. N., Aheam, J. S., Herring,. R.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12