Blank Cover Image

Atomic Force Microscope-Based Lithography of Titanium

Author(s):
Gordon, A. E.
Litfin, D. D.
Hagedorn, M. S.
Chen, J.
Fayfield, R. T.
Higman, T. K.
1 more
Publication title:
Materials - fabrication and patterning at the nanoscale : Symposium held April 19-20, 1995, San Francisco, California, USA
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
380
Pub. Year:
1995
Page(from):
125
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992832 [1558992839]
Language:
English
Call no.:
M23500/380
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Light Emission and Domain Formation in Real-Space Transfer Devices

Higman K. T., Chen J., Hagedorn S. M., Fayfield T. R.

Plenum Press
7 Conference Proceedings Application of carbon nanotube probes in a critical dimension atomic force microscope

B. C. Park, J. Choi, S. J. Ahn, D. Kim, J. Lyou, R. Dixson, N. G. Orji, J. Fu, T. V. Vorburger

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Atomic force microscope for small cantilevers

Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Miniaturized atomic force microscope for planetary exploration

Gautsch, S., Staufer, U., Akiyama, T., de Rooij, N.F., Hidber, H.R., Tonin, A., Mueller, D., Howald, L., Niedermann, P.

ESA Publications Division
3 Conference Proceedings IMAGING SINGLE NACREOUS TABLETS WITH THE ATOMIC FORCE MICROSCOPE

Giles, R., Manne, S., Zaremba, C. M., Belcher, A., Mann, S., Morse, D. E., Stucky, G. D., Hansma, P. K.

MRS - Materials Research Society
9 Conference Proceedings ATOMIC FORCE MICROSCOPE DESIGNS AND APPLICATIONS

Bryant, P.J., Miller, R.G., Deeken, R.H., Pederson, M.A.

Materials Research Society
4 Conference Proceedings Nano-oxidation of semiconductor heterostructures with atomic force microscopes:technology and applications

Heinzel,T.M., Luscher,S., Fuhrer,A., Salis,G., Held,R., Ensslin,K., Wegscheider,W., Bichler,M.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Low Voltage E-Beam Lithography with the Scanning Tunneling Microscope

Marrian C. R. K., Perkins F. K., Brandow S. L., Koloski T. S., Dobisz E. A., Calvert J. M.

Kluwer Academic Publishers
5 Conference Proceedings Atomic Scale Force Mapping with the Atomic Force Microscope

Cleveland P. J., Radmacher M., Hansma K. P.

Kluwer Academic Publishers
11 Conference Proceedings STRUCTURE AND MORPHOLOGY OF Pd OVERLAYERS ON EPITAXIAL SnO2 FILMS STUDIED WITH THE ATOMIC FORCE MICROSCOPE

Lad, R.J., Matthews, M.J., Antonik, M.D., Cavicchi, R.E., Semancik, S.

Materials Research Society
6 Conference Proceedings Dynamic studies on living cells with an atomic force fluorescence microscope

Struckmeier,J., Klopp,E., Born,M., Rink,D., Tenbosch,J., Ecke,S., Butt,H.-J., Hofmann,M.R., Jones,D.B.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Measurement of Steric Exclusion Forces with the Atomic Force Microscope

Lea, A. S., Andrade, J. D., Hlady, V.

American Chemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12