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High-Resolution X-ray-Diffraction Analysis of "Device-Quality" Cubic GaN Grown on (001)GaAs Substrate Prepared by Atomic-Hydrogen Treatment at High Temperatures

Author(s):
Yoshikawa, A.
Qin, Z. X.
Nagano, H.
Sugure, Y.
Jia, A. W.
Kobayashi, M.
Shimotomai, M.
Kato, Y.
Takahashi, K.
4 more
Publication title:
Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
482
Pub. Year:
1998
Page(from):
465
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993877 [1558993878]
Language:
English
Call no.:
M23500/482
Type:
Conference Proceedings

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