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In Situ Observation of AIN Formation During Nitridation of Sapphire by Ultrahigh Vacuum Transmission Electron Microscopy

Author(s):
Yeadon, M.
Marshall, M. T.
Hamdani, F.
Pekin, S.
Morkoc, H.
Gibson, J. M.
1 more
Publication title:
Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
482
Pub. Year:
1998
Page(from):
99
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993877 [1558993878]
Language:
English
Call no.:
M23500/482
Type:
Conference Proceedings

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