Blank Cover Image

Microstructural Observations of LPCVD Double Layer Polysilicon Thin Film Tensile Specimens

Author(s):
Publication title:
Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
472
Pub. Year:
1997
Page(from):
275
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993761 [1558993762]
Language:
English
Call no.:
M23500/472
Type:
Conference Proceedings

Similar Items:

Sharpe, W.N. Jr.,, Hemker, K.J.

Materials Research Society

7 Conference Proceedings Fracture Tests of Polysilicon Film

Sharpe, W. N., Jr., Yuan, B., Edwards, R. L.

MRS - Materials Research Society

Jayaraman, S., Edwards, R. L., Hemker, K. J.

MRS - Materials Research Society

Mitchell, S. J. N., McNeil, D. W., Raza, S. H., Armstrong, B. M., Gamble, H. S.

Materials Research Society

Bagdahn, J., Sharpe, W.N. Jr.

Materials Research Society

Zaman, R.J., Damiano, J., Jr., Batra, S., Manning, M., Banerjee, S.K.

Electrochemical Society

Legros, M., Hemker, K. J., LaVan, D. A., Sharpe, W. N., Jr., Rittner, M. N., Weertman, J. R.

MRS - Materials Research Society

Dirras, G.F., Coles, G., Wagner, A.J, Carlo, stephen, Newman, C., Hemker, K.J., Sharpe, W.N., Jr., Carlo, S.

Materials Research Society

Sharpe, W.N., Hemker, K.J.

Materials Research Society

Migliorato, P., Quinn, M.J., Tam, S.W.B., Lui, O.K.B.

Electrochemical Society

Sharpe, W. N., Jr., Turner, K., Edwards, R. L.

MRS - Materials Research Society

Kim, Y. O., Bevk, J., Furtsch, M., Georgiou, G. E., Mansfield, W., Masaitis, R., Opila, R., Silverman, P. J.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12