HIGHLY SENSITIVE ANALYSIS FOR VALENCE BAND EDGE OF C60 FILMS BY TOTAL YIELD PHOTOELECTRON SPECTROSCOPY

HIGHLY SENSITIVE ANALYSIS FOR VALENCE BAND EDGE OF C60 FILMS BY TOTAL YIELD PHOTOELECTRON SPECTROSCOPY

Author(s):

Publication title:

Novel forms of carbon II : symposium held April 4-8, 1994, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

349

Pub. Year:

1994

Page(from):

325

Pub. info.:

Pittsburgh: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992498 [1558992499]

Language:

English

Call no.:

M23500/349

Type:

Conference Proceedings

Details

TDL ID:	ZA00017982
Series ID:	PA00000011
Conf. info. (Name):	Symposium on novel forms of carbon
Conf. info. (Number):	2nd
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1994.04.04-1994.04.08

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