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Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes

Author(s):
Publication title:
Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3004
Pub. Year:
1997
Page(from):
113
Page(to):
120
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424150 [0819424153]
Language:
English
Call no.:
P63600/3004
Type:
Conference Proceedings

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