Blank Cover Image

Optimization of the enhanced evanescent wave for near-field microscopy

Author(s):
Publication title:
Proceedings of three-dimensional microscopy : image acquisition and processing IV : 12-13 February 1997, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2984
Pub. Year:
1997
Page(from):
42
Page(to):
49
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819423955 [0819423955]
Language:
English
Call no.:
P63600/2984
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Direct measurement of evanescent-wave interference patterns with laser-trapped dielectric and metallic particles

Gu,M., Ke,P.C.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Whispering gallery modes excited by two-photon absorption induced by an evanescent field 16326-14]

Kuriakose, S., Morrish, D., Gan, X., Chan, J. W. M., Gu, M.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings WD25:Mechanism of the superresolution optical near-field structure

Tsai,D.P., Ho,F.H., Yang,C.W., Gu,M., Ke,P.C.

SPIE - The International Society for Optical Engineering
8 Conference Proceedings Deep field refelction mode for high-resolution surface relief exploration by coherence probe microscopy

Montgomery,P.C., Lussert,J.-M.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Scanning near-field optical microscopy:local probes and enhanced electromagnetic fields

Aigouy,L., Boccara,A.C., Ducourtieux,S., Gresillon,S., Rivoal,J.C., Cory,H., Gadenne,P., Shalaev,V.M.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Characterization of surface and subsurface defects in optical materials using near-field evanescent wave

Yan,M., Oberhelman,S., Siekhaus,W.J., Wu,Z.L., Sheehan,L.M., Kozlowski,M.R.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings Near-field single molecule spectroscopy

X.S. Xie, R.C. Dunn

Society of Photo-optical Instrumentation Engineers
10 Conference Proceedings Near-field scanning optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides

Taylor,R.S., Leopold,K.E., Fraser,J.W., Feng,Y., Buchanan,M.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings NEAR-FIELD MICROWAVE MICROSCOPY OF MATERIALS PROPERTIES

Anlage,S.M., Steinhauer,D.E., Feenstra,B.J., Vlahacos,C.P., Wellstood,F.C.

Kluwer Academic Publishers
11 Conference Proceedings Sensitivity enhanced and polarization independent evanescent field planar ridge waveguide Bragg grating refractometer [5993-36]

Dai, X., Mihailov, S. J., Walker, R. B., Callender, C. L., Blanchetiere, C., Jiang, J.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Near-field optical manipulation with cavtiy enhanced evanescent fields [6131-24]

Reece, P. J., Garces-Chavez, V., Dholakia, K.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Particle-trapped near-field scanning optical microscopy:scattering and depolarization

Gu,M.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12