Optical properties of sol-gel Ba0.7Sr0.3TiO3 thin films studied by spectroscopic ellipsometry

Optical properties of sol-gel Ba0.7Sr0.3TiO3 thin films studied by spectroscopic ellipsometry

Author(s):

Suzuki,I. ( Tokyo Univ.of Agriculture & Technology )
Miyazaki,M.
Saitoh,T.
Xiong,Y.-M.

Publication title:

International Symposium on Polarization Analysis and Applications to Device Technology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2873

Pub. Year:

1996

Page(from):

262

Page(to):

265

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422712 [0819422711]

Language:

English

Call no.:

P63600/2873

Type:

Conference Proceedings

Details

TDL ID:	ZA00017962
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Polarization Analysis and Applications to Device Technology
Conf. info. (Number):	1996
Conf. info. (Venue):	Yokohama, Japan
Conf. info. (Date):	1996.06.12-1996.06.14

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