Blank Cover Image

First thin film ellipsometry at a photon energy of 97eV using high-performance multilayer polarizers

Author(s):
Publication title:
International Symposium on Polarization Analysis and Applications to Device Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2873
Pub. Year:
1996
Page(from):
70
Page(to):
73
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422712 [0819422711]
Language:
English
Call no.:
P63600/2873
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Polarization studies on B 1s exciton emission from h-BN using a soft x-ray multilayer polarizer

Miyata,N., Yanagihara,M., Furudate,M., Ejima,T., Watanabe,M.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings RuO2 THIN FILMS AS BOTTOM ELECTRODES FOR HIGH DIELECTRIC CONSTANT MATERIALS

Yoshikawa, K., Kimura, T., Noshiro, H., Ohtani, S., Yamada, M., Furumura, Y.

MRS - Materials Research Society
2 Conference Proceedings Structural Analysis of ZnO Thin Films Grown in Room Temperature on PET Film

H. Yamamoto, K. Idehara, R. Kimura, H. Nishigaki, N. Hasuike

Trans Tech Publications
8 Conference Proceedings CHARACTERIZATION OF POLYCRYSTALLINE SILICON MULTILAYERS WITH THIN NITRIDE/OXIDE FILMS USING SPECTROSCOPIC ELLIPSOMETRY

Asinovsky, L. M.

MRS - Materials Research Society
3 Conference Proceedings Compact debris shutter design of a laser-produced plasma source for high-NA application

Yamamoto,M., Furudate,M., Sato,N., Takagi,H.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Interfacial Reaction in Aluminum/Carbon Multilayer Thin Films

Landry, K., Sieber, H., Sui, M., Perepezko, J. H.

MRS - Materials Research Society
4 Conference Proceedings Advanced ellipsometry for very thin films and multilayers

Paduschek,P., Tamme,M., Hankey,T.D.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Entangled-photon ellipsometry

Sergienko, A.V., Abouraddy, A.F., Toussaint, K.C., Jr., Saleh, B.E.A., Teich, M.C.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings High Performance Thin Lithium-Ion Battery Using an Aluminum-Plastic Laminated Film Bag

Ohsaki, T., Takami, N., Kanda, M., Yamamoto, M.

Elsevier
11 Conference Proceedings Atom Probe Tomography Characterization of Thin Film Multilayers

Thompson, G. B., Miller, M. K., Banerjee, R., Fraser, H. L.

Materials Research Society
6 Conference Proceedings HIGH-QUALITY THIN Si FILM BY SPE REGROWTN ON EPITAXIALLY GROWN SPINEL

Kimura, T., Yamawaki, H., Arimoto, Y., Ikeda, K., Ihara, M., Ozeki, M.

Materials Research Society
12 Conference Proceedings CHARACTERIZATION OF SiGe EPITAXIAL FILMS USING ELLIPSOMETRY AND X-RAY FLUORESCENCE

Munukutla, L.V., Evans, K., Liaw, M.H.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12