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Breakdown at window interfaces caused by high-power microwave fields

Author(s):
Publication title:
Intense microwave pulses IV : 7-8 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2843
Pub. Year:
1996
Page(from):
153
Page(to):
159
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422316 [0819422312]
Language:
English
Call no.:
P63600/2843
Type:
Conference Proceedings

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