Characterization of diamond thin films using transmission electron microscopy

Characterization of diamond thin films using transmission electron microscopy

Author(s):

Csencsits,R. ( Argonne National Lab. )
Gruen,D.M.
Krauss,A.R.
Zuiker,C.D.

Publication title:

Optical Engineering Midwest '95

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2622

Pub. Year:

1995

Vol.:

Part1

Page(from):

405

Page(to):

406

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819419866 [0819419869]

Language:

English

Call no.:

P63600/2622

Type:

Conference Proceedings

Details

TDL ID:	ZA00017937
Series ID:	PA00000029
Conf. info. (Name):	Optical Engineering Midwest
Conf. info. (Number):	1995
Conf. info. (Venue):	Chicago, IL, USA
Conf. info. (Date):	1995.05.18-1995.05.19

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