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Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond"Excite-Probe"Techniques

Author(s):
Gaubas,E.
Mizeikis,V.
Bastiene,L.
Jarasiunas,K.
Lovergine,N.
Mancini,A.M.
Prete,P.
Subacius,L.
3 more
Publication title:
Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998
Title of ser.:
Materials science forum
Ser. no.:
297-298
Pub. Year:
1999
Page(from):
111
Page(to):
114
Pub. info.:
Zurich-Uetikon, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498246 [0878498249]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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