Structural Characterization of Epitaxial YBa2Cu307 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Microscopy

Structural Characterization of Epitaxial YBa2Cu307 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Microscopy

Author(s):

Publication title:

Atomic structures of high-T[c] superconductors

Title of ser.:

Materials science forum

Ser. no.:

129

Pub. Year:

1993

Page(from):

99

Page(to):

118

Pub. info.:

Aedermannsdorf: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496631 [0878496637]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00017899
Series ID:	PA00000012
Conf. info. (Name):	Symposium on High Tc Superconductors ; sia-Pacific Electron Microscopy Conference
Conf. info. (Number):	1992 ; 5th
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	1992.08.02-1992.08.06

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