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Hall Effect,DLTS and Optical Investigations on the Intrinsic 78/203 meV Acceptor in GaAs

Author(s):
Roos,G.
Schbner,A.
Pensl,G.
Krambrock,K.
Meyer,B.K.
Spaeth,J.-M.
Wagner,J.
2 more
Publication title:
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
Title of ser.:
Materials science forum
Ser. no.:
38-41
Pub. date:
1989
Vol.:
Part2
Page(from):
951
Page(to):
956
Pub. info.:
Aederlmannsdorf, Switzwelns: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495849 [0878495843]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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