Blank Cover Image

Temperature Dependence of the Capture Cross Section of Seo as Measured by Microwave Absorption Spectroscopy(MAS)

Author(s):
Publication title:
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
Title of ser.:
Materials science forum
Ser. no.:
38-41
Pub. date:
1989
Vol.:
Part1
Page(from):
469
Page(to):
472
Pub. info.:
Aederlmannsdorf, Switzwelns: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495849 [0878495843]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Lavine,J.P., Banghart,E.K., Nelson,E.T., DesJardin,W.F., Burkey,B.C.

Trans Tech Publications

Omling,P., Silverberg,P., Samuelson,L.

Trans Tech Publications

Moortgat K. G., Meller R., Schneider W.

Springer-Verlag

GAYTHER, D.B.

National Aeronautics and Space Administration

Zemon, S., Lambert, G., Miniscalco, W. J., Andrews, L. J., Hall, B. T.

Materials Research Society

Zemon, S., Pedersen, B., Lambert, G., Miniscalco, W.J., Hall, B.T., Folweiler, R.C., Thompson, B.A., Andrews, L.J.

Materials Research Society

J. B. Kiser, N. Chandrasekharan, B. M. Cullum

Society of Photo-optical Instrumentation Engineers

SIMON, P. C.

National Aeronautics and Space Administration

Konstanze Bogumil, Johannes Orphal, John P. Burrows

ESA Publications Division

Lau,Y.-Y., Spencer,T.A.

SPIE-The International Society for Optical Engineering

Chirkova,EG, Druzhinin,YuP

Trans Tech Publications

L. Song, X. Wang, D. Guo, T. Ma

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12