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Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon

Author(s):
Deicher,M.
Grubel,G.
Keller,R.
Recknagel,E.
Schulz,N.
Skudlik,H.
Wichert,Th.
2 more
Publication title:
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
Title of ser.:
Materials science forum
Ser. no.:
38-41
Pub. date:
1989
Vol.:
Part1
Page(from):
367
Page(to):
372
Pub. info.:
Aederlmannsdorf, Switzwelns: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495849 [0878495843]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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