Blank Cover Image

Equilibrium Geometries and Electronic Structure of Oxygen Related Defects in Silicon

Author(s):
Kelly,P.J.  
Publication title:
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
Title of ser.:
Materials science forum
Ser. no.:
38-41
Pub. Year:
1989
Vol.:
Part1
Page(from):
269
Page(to):
274
Pub. info.:
Aederlmannsdorf, Switzwelns: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495849 [0878495843]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings DEFECT STRUCTURE AND DYNAMICS SILICON

Pantelides, S.T., Car, R., Kelly, P.J., Oshiyama, A.

Materials Research Society

Michel J., Niklas J.R., Spaeth J. M.

Materials Research Society

2 Conference Proceedings OXYGEN-RELATED DEFECTS IN SILICON

Lindstron, Lennart J., Svensson, Bengt G.

Materials Research Society

MASCHER,P., DANNEFAER,S., KERR,D., HAHN,S.

Trans Tech Publications

Vanhellemont, J., Simoen, E., Bosman, G., Claeys, C., Kaniava, A., Gaubas, E., Blondeel, A., Clauws, P.

Electrochemical Society

Caplan, P.J., Poindexter, E.H., Vasudev, P.K., Henderson, R.C.

Materials Research Society

P. Hens, J. Müller, E. Spiecker, P.J. Wellmann

Trans Tech Publications

Libezny, M., Kaniava, A., Kissinger, G., Nijs, J., Claeys, C., Vanhellemont, J.

Electrochemical Society

Vanhellemont, J., Kaniava, A., Libezny, M., Simoen, E., Kissinger, G., Gaubas, E., Claeys, C., Clauws, P.

MRS - Materials Research Society

Smith, III, T.P., Phillips, J.M., People, R., Gibson, J.M., Pfeiffer, L., Stiles, P.J.

Materials Research Society

Dalibor,T., Pensl,G., Yamamoto,T., Kimoto,T., Matsunami,H., Sridhara,S.G., Nizhner,D.G., Devaty,R.P., Choyke,W.J.

Trans Tech Publications

Lin-Chung, P.J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12