Correlation between crystal morphology and x-ray performance of a CdZnTe detector

Correlation between crystal morphology and x-ray performance of a CdZnTe detector

Author(s):

Bavdaz,M. ( European Space Agency/ESTEC (Netherlands) )

Peacock,A.J. ( European Space Agency/ESTEC (Netherlands) )

Nenonen,S. A. ( Metorex International Oy (Finland) )

Jantunen,M. A. ( Metorex International Oy (Finland) )

Gagliardi,T. ( Metorex International Oy (Finland) )

Tuomi,T. O. ( Helsinki Univ.of Technology (Finland) )

Hjelt,K. T. ( Helsinki Univ.of Technology (Finland) )

Juvonen,M. ( Helsinki Univ.of Technology (Finland) )

Rantamaki,R. ( Helsinki Univ.of Technology (Finland) )

Kraft,S. ( Physikalisch-Technische Bundesanstalt (FRG) )

Wedowski,M. ( Physikalisch-Technische Bundesanstalt (FRG) )

Scholze,F. ( Physikalisch-Technische Bundesanstalt (FRG) )

Ulm,G. ( Physikalisch-Technische Bundesanstalt (FRG) )

McNally,P. ( Dublin City Univ.(Ireland) )

Curley,J. ( Dublin City Univ.(Ireland) )

Danilewsky,A. N. ( Albert-Ludwigs-Univ.(FRG) )

11 more

Publication title:

EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3114

Pub. Year:

1997

Page(from):

322

Page(to):

332

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425362 [0819425362]

Language:

English

Call no.:

P63600/3114

Type:

Conference Proceedings

Details

TDL ID:	ZA00017875
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : EUV,X-Ray, and Gamma-Ray Instrumentation for Astronomy
Conf. info. (Number):	1997 : 8th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.01-1997.08.01

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