Inorganic antireflective coating process for deep-UV lithography
- Author(s):
He,Q. ( Texas Instruments Inc. ) Lee,W.W. ( Texas Instruments Inc. ) Hanratty,M.A. ( Texas Instruments Inc. ) Rogers,D. ( Texas Instruments Inc. ) Xing,G. ( Texas Instruments Inc. ) Singh,A. ( Texas Instruments Inc. ) Zielinski,E. ( Texas Instruments Inc. ) - Publication title:
- Optical microlithography XI : 25-27 February 1998, Santa Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3334
- Pub. Year:
- 1998
- Page(from):
- 337
- Page(to):
- 346
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427793 [0819427799]
- Language:
- English
- Call no.:
- P63600/3334
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Mechanism of deep-UV photoresist tail on inorganic antireflective layer film
SPIE-The International Society for Optical Engineering |
Martinus Nijhoff Publishers |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Developable bottom antireflective coatings for 248-nm and 193-nm lithography
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Process and resolution enhancement using a new inorganic bottom antireflective layer for i-line lithography
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Optimization and performance of AlGaN-based multi-quantum-well deep-UV LEDs
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |