Blank Cover Image

Two-dimensional simulation of Far-Ultraviolet Spectroscopic Explorer (FUSE) spectra

Author(s):
Sahnow,D.J. ( Johns Hopkins Univ. )  
Publication title:
Space telescopes and instruments V : 25-28 March 1998, Kona, Hawaii
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3356
Pub. Year:
1998
Vol.:
Part 2
Pt.:
2
Page(from):
1011
Page(to):
1017
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428035 [0819428035]
Language:
English
Call no.:
P63600/3356
Type:
Conference Proceedings

Similar Items:

Sahnow,D.J., Moos,H.W., Ake,T.B., Andersson,B.-G., Andre,M., Artis,D., Berman,A.F., Blair,W.P., Brownsberger,K.R., …

SPIE - The International Society for Optical Engineering

Sahnow,D.J., Moos,H.W., Friedman,S.D., Blair,W.P., Conard,S.J., Kruk,J.W., Murphy,E.M., Oegerle,W.R., Ake,T.B.

SPIE-The International Society for Optical Engineering

Sahnow,D.J., Friedman,S.D., Moos,H.W., Green,J.C., Siegmund,O.H.W.

SPIE-The International Society for Optical Engineering

Cha,N., Sahnow,D.J., Moos,H.W.

SPIE - The International Society for Optical Engineering

Sahnow,D.J., Friedman,S.D., Oegerle,W.R., Moos,H.W., Green,J.C., Siegmund,O.H.W.

SPIE-The International Society for Optical Engineering

Sahnow, D.J.

SPIE-The International Society for Optical Engineering

Wilkinson,E., Green,J.C., Osterman,S.N., Brownsberger,K.R., Sahnow,D.J.

SPIE-The International Society for Optical Engineering

A.F. Shipley, J.C. Green, J.P. Andrews

Society of Photo-optical Instrumentation Engineers

Sahnow,D.J., VanDyke,C.M., Gong,Q., Bremer,J.C., Kennedy,M.J.

SPIE-The International Society for Optical Engineering

Conard,S.J., Redman,K.W., Barkhouser,R.H., McGuffey,D.B., Smee,S., Ohl,R.G., Kushner,G.D.

SPIE - The International Society for Optical Engineering

Friedman,S.D., Conard,S.J., Barkhouser,R.H., Brownsberger,K.R., Cha,A.N., Fullerton,A.W., Kruk,J.W., Moos,W., …

SPIE - The International Society for Optical Engineering

Kennedy,M.J., Friedman,S.D., Barkhouser,R.H., Hampton,J., Nikulla,P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12