Superresolved imaging sensors with field-of-view preservation

Superresolved imaging sensors with field-of-view preservation

Author(s):

Reynolds,W.R. ( Signature Research,Inc. )
Hilgers,J.W. ( Signature Research,Inc. )
Schulz,T.J. ( Michigan Technological Univ. )
Amphay,S.A. ( Air Force Research Lab. )

Publication title:

Passive millimeter-wave imaging technology II : 13 April 1998, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3378

Pub. date:

1998

Page(from):

134

Page(to):

147

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428271 [0819428272]

Language:

English

Call no.:

P63600/3378

Type:

Conference Proceedings

Details

TDL ID:	ZA00017851
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Passive Millimeter-Wave Imaging Technology
Conf. info. (Number):	1998 : 2nd
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1998.04.13

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