X-ray imaging with semiconductor films (Invited Paper)

Author(s):

Shah,K.S. ( Radiation Monitoring Devices,Inc. )

Bennett,P.R. ( Radiation Monitoring Devices,Inc. )

Cirignano,L.J. ( Radiation Monitoring Devices,Inc. )

Dmitriyev,Y. ( Radiation Monitoring Devices,Inc. )

Klugerman,M. ( Radiation Monitoring Devices,Inc. )

Mandal,K. ( Radiation Monitoring Devices,Inc. )

Moy,L.P. ( Radiation Monitoring Devices,Inc. )

Street,R.A. ( Xerox Palo Alto Research Ctr. )

3 more

Publication title:

Hard X-ray and gamma-ray detector physics and applications : 22-23 July 1998, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3446

Pub. Year:

1998

Page(from):

102

Page(to):

113

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819429018 [0819429015]

Language:

English

Call no.:

P63600/3446

Type:

Conference Proceedings