
Influence of IMP copper flash layer on the properties of copper films deposited by metal organic chemical vapor deposition
- Author(s):
Li,C.Y. ( Institute of Microelectronics ) Zhang,D.H. Qian,Y. Narayanan,B. Wu,J.J. Yu,B. Jiang,Z.X. Foo,P.D. Xie,J. Zhang,Q. Yoon,S.F. - Publication title:
- Multilevel Interconnect Technology III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3883
- Pub. Year:
- 1999
- Page(from):
- 46
- Page(to):
- 49
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819434807 [0819434809]
- Language:
- English
- Call no.:
- P63600/3883
- Type:
- Conference Proceedings
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