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Application of phase-edge PSM for narrow logic gate

Author(s):
Kim,B. ( Samsung Electronics Co.Ltd. )
Park,C.
Ryoo,M.
Lee,K.
Cho,H.
Moon,J.
1 more
Publication title:
19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3873
Pub. Year:
1999
Vol.:
Part2
Page(from):
943
Page(to):
952
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780849434686 [084943468X]
Language:
English
Call no.:
P63600/3873
Type:
Conference Proceedings

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