Blank Cover Image

Two error sources in grating projection profilometry:analysis and compensation

Author(s):
Publication title:
Optical Manufacturing and Testing III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3782
Pub. Year:
1999
Page(from):
554
Page(to):
558
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432681 [0819432687]
Language:
English
Call no.:
P63600/3782
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Shape measurement of objects with large discontinuities and surface isolations using complementary grating projection

Hao,Y., Zhao,Y., Li,D.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Design of temporal phase unwrapping algorithms

Hao,Y., Zhao,Y., Li,D.

SPIE - The International Society for Optical Engineering
2 Conference Proceedings Iterative estimation of phase distribution on reference planes in grating projection profilometry

X. Zhang, B. Zhang, Y. Lin, D. Liu, X. Li

Society of Photo-optical Instrumentation Engineers
8 Conference Proceedings Tilt Error Analysis and Compensation for Two-Position North Determining Scheme in FOG North-Seeker

Pei, Ren Zhong, Li, Deng Hua, Duan, Ke Ke

Trans Tech Publications
3 Conference Proceedings Error analysis and compensation of a strapdown inertial continuous surveying system

Q. Kong, J. Zhao, F. Li

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Repeated phase-offset measurement for error compensation in two-step triangular phase- shifting profilometry [6375-12]

Jia, P., Kofman, J., English, C.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Fast profilometry based on the projection of a single grating at two frequencles

Sansoni,G., Carocci,M.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings New PMP Method with Two-frequency Grating Projection,

Li,J.-L., Su,X.-Y., Su,H.-J.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Large-scale form and position error measurement

Hao,Q., Li,D.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Three-dimensional profilometry using hybrid grating projection

Yoshizawa,T., Takahashi,H., Yamamoto,M., Otani,Y., Fujita,H.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Nonlinear excess fraction method:a robust temporal phase-unwrapping algorithm

Hao,Y., Zhao,Y., Li,D.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings Analytical light source illuminance in liquid crystal projection TV

K.-V. Chen, S.-M. Chen, Z.-D. Hao

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12