Blank Cover Image

Novel image processing method applied to speckle fringe pattern based on the wavelet transform

Author(s):
Publication title:
Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3740
Pub. Year:
1999
Page(from):
626
Page(to):
629
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432148 [0819432148]
Language:
English
Call no.:
P63600/3740
Type:
Conference Proceedings

Similar Items:

Miao,H., Jiang,Z.Y., Qian,K.M., Wu,X.P.

SPIE-The International Society for Optical Engineering

Krager,S., Bouamama,L., Gruber,H., Teiwes,S., Wernicke,G.K.

SPIE - The International Society for Optical Engineering

Miao,H., Ge,F., Jiang,Z.Y., Wu,X.P., Lu,J.

SPIE-The International Society for Optical Engineering

Qian, K., Wang, J.

SPIE-The International Society for Optical Engineering

Qian, K., Wu. X., Asundi, A.K.

SPIE-The International Society for Optical Engineering

L. T. H. Nam, K. Qian

Society of Photo-optical Instrumentation Engineers

Nie, Y., Yan, H., Du, Y., Wu, Y., Yao, X., Shi, B.

SPIE - The International Society of Optical Engineering

Wu, X., Liu, Z., Miao, H., Gu, P.

SPIE - The International Society of Optical Engineering

Shakher,C., Kumar,R., Singh,S.K., Kazmi,S.A.

SPIE-The International Society for Optical Engineering

Qu,J., Wang,C.

SPIE-The International Society for Optical Engineering

X. Li, Z. Zhang, X. Wu

Society of Photo-optical Instrumentation Engineers

Shakher, C., Kumar, R.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12