Accurate measurement of the flatness of etalons
- Author(s):
- Publication title:
- Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3740
- Pub. Year:
- 1999
- Page(from):
- 606
- Page(to):
- 609
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432148 [0819432148]
- Language:
- English
- Call no.:
- P63600/3740
- Type:
- Conference Proceedings
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