Nonuniformity correction of resistor arrays with a precision projector/sensor mapping method

Nonuniformity correction of resistor arrays with a precision projector/sensor mapping method

Author(s):

Venables,M.A. ( British Aerospace Ltd. )
Lake,S.P.
Gough,D.W.
Pritchard,A.P.

Publication title:

Technologies for synthetic environments : hardware-in-the-loop testing IV : 5-7 April 1999, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3697

Pub. Year:

1999

Page(from):

414

Page(to):

421

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431714 [0819431710]

Language:

English

Call no.:

P63600/3697

Type:

Conference Proceedings

Details

TDL ID:	ZA00017616
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Technologies for Synthetic Environments : Hardware-in-the-Loop Testing
Conf. info. (Number):	1999 : 4th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1999.04.05-1999.04.07

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