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Pair charge correlations in silicon nanostructures

Author(s):
Bagraev,N.T. ( A.F.loffe Physical-Technical Institute )
Bouravleuv,A.D.
Gasumyants,V.E.
Gehihoff,W.
Klyachkin,L.E.
Malyarenko,A.M.
Naeser,A.F.A.
Romanov,V.V.
Rykov,S.A.
Vladimirskaya,E.V.
5 more
Publication title:
International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3687
Pub. date:
1999
Page(from):
105
Page(to):
111
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431615 [0819431613]
Language:
English
Call no.:
P63600/3687
Type:
Conference Proceedings

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