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Collective effects in resonant negative ion photodetachment

Author(s):
Publication title:
International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3687
Pub. Year:
1999
Page(from):
90
Page(to):
101
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431615 [0819431613]
Language:
English
Call no.:
P63600/3687
Type:
Conference Proceedings

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